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[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Automated integration of fault injection into the ASIC design flow

✍ Scribed by Simevski, Aleksandar; Kraemer, Rolf; Krstic, Milos

Book ID: 126665104
Publisher: IEEE
Year: 2013
Weight: 869 KB
Category: Article
ISBN: 1479915831
DOI: 10.1109/DFT.2013.6653615

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