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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Reliability of 10Gb/s 850nm oxide confined vertical cavity surface emitting lasers

✍ Scribed by Meng Haijie, ; Zhang Zhenfeng, ; Wang Shancheng, ; Ding Guoqing, ; Zhou Zhonghua,

Book ID: 121719909
Publisher: IEEE
Year: 2013
Weight: 188 KB
Category: Article
ISBN: 1479912417
DOI: 10.1109/ipfa.2013.6599271

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