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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Reliability of oxide TFT for display application

✍ Scribed by Jang, J.; Um, J. K.; Mativenga, M.

Book ID: 121698197
Publisher: IEEE
Year: 2013
Weight: 1018 KB
Category: Article
ISBN: 1479912417
DOI: 10.1109/ipfa.2013.6599184

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