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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Fault missing rate analysis of the arithmetic residue codes based fault-tolerant FIR filter design

✍ Scribed by Gao, Zhen; Yang, Wenhui; Chen, Xiang; Zhao, Ming; Wang, Jing

Book ID: 118016015
Publisher: IEEE
Year: 2012
Weight: 281 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313856

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