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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - The influence of clock-gating on NBTI-induced delay degradation

✍ Scribed by Pachito, J.; Martins, C. V.; Semiao, J.; Santos, M.; Teixeira, I. C.; Teixeira, J. P.

Book ID: 115536502
Publisher: IEEE
Year: 2012
Weight: 287 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313842

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