𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - An efficient probability framework for error propagation and correlation estimation

✍ Scribed by Liang Chen, ; Tahoori, Mehdi B.

Book ID: 115532771
Publisher: IEEE
Year: 2012
Weight: 224 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313867

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Analysis of FinFET technology on memories

✍ Amat, E.; Asenov, A.; Canal, R.; Cheng, B.; Cruz, J-Ll.; Jaksic, Z.; Miranda, M. 📂 Article 📅 2012 🏛 IEEE ⚖ 121 KB

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - SEU tolerant robust memory cell design

✍ Shayan, Md; Singh, Virendra; Singh, Adit D; Fujita, Masahiro 📂 Article 📅 2012 🏛 IEEE ⚖ 561 KB

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Logic masking for SET Mitigation Using Approximate Logic Circuits

✍ Sanchez-Clemente, A.; Entrena, L.; Garcia-Valderas, M.; Lopez-Ongil, C. 📂 Article 📅 2012 🏛 IEEE ⚖ 250 KB

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - The influence of clock-gating on NBTI-induced delay degradation

✍ Pachito, J.; Martins, C. V.; Semiao, J.; Santos, M.; Teixeira, I. C.; Teixeira, 📂 Article 📅 2012 🏛 IEEE ⚖ 287 KB

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Towards optimized functional evaluation of SEE-induced failures in complex designs

✍ Alexandrescu, Dan; Costenaro, Enrico 📂 Article 📅 2012 🏛 IEEE ⚖ 293 KB

[IEEE 2012 IEEE 18th International On-Li

[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Through-silicon-via built-in self-repair for aggressive 3D integration

✍ Nicolaidis, Michael; Pasca, Vladimir; Anghel, Lorena 📂 Article 📅 2012 🏛 IEEE ⚖ 754 KB