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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Analysis of FinFET technology on memories

✍ Scribed by Amat, E.; Asenov, A.; Canal, R.; Cheng, B.; Cruz, J-Ll.; Jaksic, Z.; Miranda, M.; Rubio, A.; Zuber, P.

Book ID: 118166279
Publisher: IEEE
Year: 2012
Weight: 121 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313866

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