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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - SEU tolerant robust memory cell design

✍ Scribed by Shayan, Md; Singh, Virendra; Singh, Adit D; Fujita, Masahiro

Book ID: 115532770
Publisher: IEEE
Year: 2012
Weight: 561 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313834

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