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[IEEE 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012) - Sitges, Spain (2012.06.27-2012.06.29)] 2012 IEEE 18th International On-Line Testing Symposium (IOLTS) - Logic masking for SET Mitigation Using Approximate Logic Circuits

✍ Scribed by Sanchez-Clemente, A.; Entrena, L.; Garcia-Valderas, M.; Lopez-Ongil, C.

Book ID: 115525641
Publisher: IEEE
Year: 2012
Weight: 250 KB
Category: Article
ISBN: 1467320846
DOI: 10.1109/iolts.2012.6313868

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