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[IEEE 2012 12th International Workshop on Junction Technology (IWJT) - Shanghai (2012.05.14-2012.05.15)] 2012 12th International Workshop on Junction Technology - An efficient model for trap analysis in C-V measurement for AlGaN/GaN heterostructure

✍ Scribed by Liang Li, ; Wei Mao, ; Lin-An Yang, ; Jin-Cheng Zhang, ; Qian-Wei Kuang, ; Yue Hao,

Book ID: 121236311
Publisher: IEEE
Year: 2012
Weight: 442 KB
Category: Article
ISBN: 1467312568
DOI: 10.1109/IWJT.2012.6212825

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