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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Die-level adaptive test: Real-time test reordering and elimination

✍ Scribed by Gotkhindikar, K. R.; Daasch, W. R.; Butler, K. M.; Carulli, J. M.; Nahar, A.

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