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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Faster-than-at-speed test for increased test quality and in-field reliability

✍ Scribed by Yoneda, Tomokazu; Hori, Keigo; Inoue, Michiko; Fujiwara, Hideo

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