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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - A Software-Based Self-Test methodology for on-line testing of processor caches

โœ Scribed by Theodorou, G.; Kranitis, N.; Paschalis, A.; Gizopoulos, D.


Book ID
121237773
Publisher
IEEE
Year
2011
Weight
485 KB
Category
Article
ISBN
1457701510

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