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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Defect Oriented Testing for analog/mixed-signal devices

✍ Scribed by Kruseman, Bram; Tasic, Bratislav; Hora, Camelia; Dohmen, Jos; Hashempour, Hamidreza; van Beurden, Maikel; Xing, Yizi

Book ID: 120647446
Publisher: IEEE
Year: 2011
Weight: 519 KB
Category: Article
ISBN: 1457701510
DOI: 10.1109/TEST.2011.6139127

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