✦ LIBER ✦

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Generic, orthogonal and low-cost March Element based memory BIST

✍ Scribed by van de Goor, Ad J.; Hamdioui, Said; Kukner, Halil

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 IEEE International Test Confe

✍ Rajski, Janusz; Moghaddam, Elham K.; Reddy, Sudhakar M. 📂 Article 📅 2011 🏛 IEEE ⚖ 356 KB

[IEEE 2011 IEEE International Test Confe

✍ Kruseman, Bram; Tasic, Bratislav; Hora, Camelia; Dohmen, Jos; Hashempour, Hamidr 📂 Article 📅 2011 🏛 IEEE ⚖ 519 KB

[IEEE 2011 IEEE International Test Confe

✍ Ingelsson, Urban; Al-Hashimi, Bashir M. 📂 Article 📅 2011 🏛 IEEE ⚖ 938 KB

[IEEE 2011 IEEE International Test Confe

✍ Gotkhindikar, K. R.; Daasch, W. R.; Butler, K. M.; Carulli, J. M.; Nahar, A. 📂 Article 📅 2011 🏛 IEEE ⚖ 810 KB

[IEEE 2011 IEEE International Test Confe

✍ Theodorou, G.; Kranitis, N.; Paschalis, A.; Gizopoulos, D. 📂 Article 📅 2011 🏛 IEEE ⚖ 485 KB

[IEEE 2011 IEEE International Test Confe

✍ Sunter, Stephen; Roy, Aubin 📂 Article 📅 2011 🏛 IEEE ⚖ 364 KB