✦ LIBER ✦

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Investigation into voltage and process variation-aware manufacturing test

✍ Scribed by Ingelsson, Urban; Al-Hashimi, Bashir M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 IEEE International Test Confe

✍ Rajski, Janusz; Moghaddam, Elham K.; Reddy, Sudhakar M. 📂 Article 📅 2011 🏛 IEEE ⚖ 356 KB

[IEEE 2011 IEEE International Test Confe

✍ Gotkhindikar, K. R.; Daasch, W. R.; Butler, K. M.; Carulli, J. M.; Nahar, A. 📂 Article 📅 2011 🏛 IEEE ⚖ 810 KB

[IEEE 2011 IEEE International Test Confe

✍ Kruseman, Bram; Tasic, Bratislav; Hora, Camelia; Dohmen, Jos; Hashempour, Hamidr 📂 Article 📅 2011 🏛 IEEE ⚖ 519 KB

[IEEE 2011 IEEE International Test Confe

✍ Yoneda, Tomokazu; Hori, Keigo; Inoue, Michiko; Fujiwara, Hideo 📂 Article 📅 2011 🏛 IEEE ⚖ 350 KB

[IEEE 2011 IEEE International Test Confe

✍ van de Goor, Ad J.; Hamdioui, Said; Kukner, Halil 📂 Article 📅 2011 🏛 IEEE ⚖ 553 KB

[IEEE 2011 IEEE International Test Confe

✍ Theodorou, G.; Kranitis, N.; Paschalis, A.; Gizopoulos, D. 📂 Article 📅 2011 🏛 IEEE ⚖ 485 KB