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[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Dual gate photo-thin film transistor with high photoconductive gain for high reliability, and low noise flat panel transparent imager

✍ Scribed by Sanghun Jeon, ; Seung-Eon Ahn, ; Ihun Song, ; Yongwoo Jeon, ; Young Kim, ; Sangwook Kim, ; Hyunsik Choi, ; Hojung Kim, ; Eunha Lee, ; Sungsik Lee, ; Nathan, Arokia; Robertson, John; Changjung Kim, ; U-In Chung, ; Inkyung Yoo, ; Kinam Kim,

Book ID: 126809798
Publisher: IEEE
Year: 2011
Weight: 919 KB
Category: Article
ISBN: 1457705044
DOI: 10.1109/iedm.2011.6131551

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