✦ LIBER ✦

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - High performance SiC trench devices with ultra-low ron

✍ Scribed by Nakamura, T.; Nakano, Y.; Aketa, M.; Nakamura, R.; Mitani, S.; Sakairi, H.; Yokotsuji, Y.

No coin nor oath required. For personal study only.

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