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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Approximations to field-effect factor and their use in GIDL modeling

✍ Scribed by Kozhukhov, Nikita; Byoungchan Oh, ; Hyungcheol Shin,

Book ID: 118270487
Publisher: IEEE
Year: 2011
Weight: 285 KB
Volume: 0
Category: Article
ISBN: 1457701596
DOI: 10.1109/ipfa.2011.5992740

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