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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Interface analysis of epi-Si(111)/Y2O3/Pr2O3/Si(111) heterostructures

✍ Scribed by Yang, J.-M.; Kim, J. W.; Wilke, A.; Seifarth, O.; Schroeder, T.

Book ID: 120651429
Publisher: IEEE
Year: 2011
Weight: 391 KB
Category: Article
ISBN: 1457701596
DOI: 10.1109/IPFA.2011.5992761

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