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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Identification of electronic traps in AlGaN/GaN HEMTs using UV light-assisted trapping analysis

✍ Scribed by Tapajna, M.; Simms, R. J. T.; Faqir, M.; Kuball, M.; Pei, Y.; Mishra, U. K.

Book ID: 126515538
Publisher: IEEE
Year: 2010
Weight: 266 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488837

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