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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A review on the reliability of GaN-based laser diodes

✍ Scribed by Trivellin, Nicola; Meneghini, Matteo; Zanoni, Enrico; Orita, Kenji; Yuri, Masaaki; Meneghesso, Gaudenzio

Book ID: 121858490
Publisher: IEEE
Year: 2010
Weight: 356 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488866

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