𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - ESD protection for high-speed receiver circuits

✍ Scribed by Jack, Nathan; Rosenbaum, Elyse

Book ID: 124060828
Publisher: IEEE
Year: 2010
Weight: 380 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488722

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Soft error assessments for servers

✍ Muller, K Paul; Sanda, Pia N. 📂 Article 📅 2010 🏛 IEEE ⚖ 191 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Interface-trap modeling for silicon-nanowire MOSFETs

✍ Chen, Zuhui; Zhou, Xing; Zhu, Guojun; Lin, Shihuan 📂 Article 📅 2010 🏛 IEEE ⚖ 370 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability status of GaN transistors and MMICs in Europe

✍ Dammann, M.; Casar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Ki 📂 Article 📅 2010 🏛 IEEE ⚖ 337 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A review on the reliability of GaN-based laser diodes

✍ Trivellin, Nicola; Meneghini, Matteo; Zanoni, Enrico; Orita, Kenji; Yuri, Masaak 📂 Article 📅 2010 🏛 IEEE ⚖ 356 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Photovoltaic module reliability studies at the Florida Solar Energy Center

✍ Dhere, Neelkanth G.; Pethe, Shirish A.; Kaul, Ashwani 📂 Article 📅 2010 🏛 IEEE ⚖ 544 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability study of bilayer graphene - material for future transistor and interconnect

✍ Tianhua Yu, ; Eun-Kyu Lee, ; Briggs, Benjamin; Nagabhirava, Bhaskar; Bin Yu, 📂 Article 📅 2010 🏛 IEEE ⚖ 494 KB