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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability study of bilayer graphene - material for future transistor and interconnect

✍ Scribed by Tianhua Yu, ; Eun-Kyu Lee, ; Briggs, Benjamin; Nagabhirava, Bhaskar; Bin Yu,

Book ID: 126608874
Publisher: IEEE
Year: 2010
Weight: 494 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488851

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