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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Effect of multiple-transistor charge collection on SET pulse widths

✍ Scribed by Ahlbin, J. R.; Gadlage, M. J.; Atkinson, N. M.; Bhuva, B. L.; Witulski, A. F.; Holman, W. T.; Massengill, L. W.; Eaton, P. H.; Narasimham, B.

Book ID: 121326436
Publisher: IEEE
Year: 2010
Weight: 400 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488828

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