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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability status of GaN transistors and MMICs in Europe

✍ Scribed by Dammann, M.; Casar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Kiefer, R.; Muller, S.; Mikulla, M.; van der Wel, P. J.; Rodle, T.; Bourgeois, F.; Riepe, K.

Book ID: 118151606
Publisher: IEEE
Year: 2010
Weight: 337 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488841

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