[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A generalized, IB-independent, physical HCI lifetime projection methodology based on universality of hot-carrier degradation

[IEEE 2010 IEEE International Reliabilit

✍ Muller, K Paul; Sanda, Pia N. 📂 Article 📅 2010 🏛 IEEE ⚖ 191 KB

[IEEE 2010 IEEE International Reliabilit

✍ Trivellin, Nicola; Meneghini, Matteo; Zanoni, Enrico; Orita, Kenji; Yuri, Masaak 📂 Article 📅 2010 🏛 IEEE ⚖ 356 KB

[IEEE 2010 IEEE International Reliabilit

✍ Chen, Zuhui; Zhou, Xing; Zhu, Guojun; Lin, Shihuan 📂 Article 📅 2010 🏛 IEEE ⚖ 370 KB

[IEEE 2010 IEEE International Reliabilit

✍ Jack, Nathan; Rosenbaum, Elyse 📂 Article 📅 2010 🏛 IEEE ⚖ 380 KB

[IEEE 2010 IEEE International Reliabilit

✍ Ryan, J.T.; Lenahan, P.M.; Grasser, T.; Enichlmair, H. 📂 Article 📅 2010 🏛 IEEE ⚖ 717 KB

[IEEE 2010 IEEE International Reliabilit

✍ Dammann, M.; Casar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Ki 📂 Article 📅 2010 🏛 IEEE ⚖ 337 KB