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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Recovery-free electron spin resonance observations of NBTI degradation

✍ Scribed by Ryan, J.T.; Lenahan, P.M.; Grasser, T.; Enichlmair, H.

Book ID: 121476855
Publisher: IEEE
Year: 2010
Weight: 717 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488854

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