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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Mobility enhancement due to charge trapping & defect generation: Physics of self-compensated BTI

โœ Scribed by Ehteshamul Islam, Ahmad; Ashraful Alam, Muhammad


Book ID
120177751
Publisher
IEEE
Year
2010
Weight
572 KB
Category
Article
ISBN
1424454301

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