𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - New statistical model to decode the reliability and weibull slope of high-κ and interfacial layer in a dual layer dielectric stack

✍ Scribed by Raghavan, N.; Pey, K.L.; Liu, W.H.; Li, X.

Book ID: 120088259
Publisher: IEEE
Year: 2010
Weight: 751 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488735

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability status of GaN transistors and MMICs in Europe

✍ Dammann, M.; Casar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Ki 📂 Article 📅 2010 🏛 IEEE ⚖ 337 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A review on the reliability of GaN-based laser diodes

✍ Trivellin, Nicola; Meneghini, Matteo; Zanoni, Enrico; Orita, Kenji; Yuri, Masaak 📂 Article 📅 2010 🏛 IEEE ⚖ 356 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability study of bilayer graphene - material for future transistor and interconnect

✍ Tianhua Yu, ; Eun-Kyu Lee, ; Briggs, Benjamin; Nagabhirava, Bhaskar; Bin Yu, 📂 Article 📅 2010 🏛 IEEE ⚖ 494 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability characterization of 32nm high-K and Metal-Gate logic transistor technology

✍ Pae, Sangwoo; Ashok, Ashwin; Jingyoo Choi, ; Ghani, Tahir; Jun He, ; Seok-hee Le 📂 Article 📅 2010 🏛 IEEE ⚖ 591 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Understanding transient latchup hazards and the impact of guard rings

✍ Farbiz, Farzan; Rosenbaum, Elyse 📂 Article 📅 2010 🏛 IEEE ⚖ 593 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Soft errors from neutron and proton-induced multiple-node events

✍ Cannon, Ethan H. 📂 Article 📅 2010 🏛 IEEE ⚖ 272 KB