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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Understanding transient latchup hazards and the impact of guard rings

✍ Scribed by Farbiz, Farzan; Rosenbaum, Elyse

Book ID: 120882966
Publisher: IEEE
Year: 2010
Weight: 593 KB
Category: Article
ISBN: 1424454301
DOI: 10.1109/IRPS.2010.5488787

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