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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - SEILA: Soft error immune latch for mitigating multi-node-SEU and local-clock-SET

✍ Scribed by Uemura, Taiki; Tosaka, Yoshiharu; Matsuyama, Hideya; Shono, Ken; Uchibori, Chihiro J.; Takahisa, Keiji; Fukuda, Mitsuhiro; Hatanaka, Kichiji

Book ID: 118129504
Publisher: IEEE
Year: 2010
Weight: 465 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488827

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