𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Off state incorporation into the 3 energy mode device lifetime modeling for advanced 40nm CMOS node

✍ Scribed by Bravaix, A.; Guerin, C.; Goguenheim, D.; Huard, V.; Roy, D.; Besset, C.; Renard, S.; Randriamihaja, Y. Mamy; Vincent, E.

Book ID: 118020312
Publisher: IEEE
Year: 2010
Weight: 590 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488852

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Soft error assessments for servers

✍ Muller, K Paul; Sanda, Pia N. 📂 Article 📅 2010 🏛 IEEE ⚖ 191 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Interface-trap modeling for silicon-nanowire MOSFETs

✍ Chen, Zuhui; Zhou, Xing; Zhu, Guojun; Lin, Shihuan 📂 Article 📅 2010 🏛 IEEE ⚖ 370 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - ESD protection for high-speed receiver circuits

✍ Jack, Nathan; Rosenbaum, Elyse 📂 Article 📅 2010 🏛 IEEE ⚖ 380 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Photovoltaic module reliability studies at the Florida Solar Energy Center

✍ Dhere, Neelkanth G.; Pethe, Shirish A.; Kaul, Ashwani 📂 Article 📅 2010 🏛 IEEE ⚖ 544 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Random telegraph signal noise in phase change memory devices

✍ Fugazza, Davide; Ielmini, Daniele; Lavizzari, Simone; Lacaita, Andrea L. 📂 Article 📅 2010 🏛 IEEE ⚖ 421 KB

[IEEE 2010 IEEE International Reliabilit

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability status of GaN transistors and MMICs in Europe

✍ Dammann, M.; Casar, M.; Konstanzer, H.; Waltereit, P.; Quay, R.; Bronner, W.; Ki 📂 Article 📅 2010 🏛 IEEE ⚖ 337 KB