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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Random telegraph signal noise in phase change memory devices

✍ Scribed by Fugazza, Davide; Ielmini, Daniele; Lavizzari, Simone; Lacaita, Andrea L.

Book ID: 118027498
Publisher: IEEE
Year: 2010
Weight: 421 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488741

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