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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Temperature assessment of AlGaN/GaN HEMTs: A comparative study by Raman, electrical and IR thermography

✍ Scribed by Killat, N.; Kuball, M.; Chou, T.-M.; Chowdhury, U.; Jimenez, J.

Book ID: 117991057
Publisher: IEEE
Year: 2010
Weight: 225 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488777

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