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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Contribution of low-energy (≪ 10 MeV) neutrons to upset rate in a 65 nm SRAM

✍ Scribed by Sierawski, Brian D.; Warren, Kevin M.; Reed, Robert A.; Weller, Robert A.; Mendenhall, Marcus M.; Schrimpf, Ronald D.; Baumann, Robert C.; Zhu, Vivian

Book ID: 118056115
Publisher: IEEE
Year: 2010
Weight: 216 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488796

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