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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - On the radiation-induced soft error performance of hardened sequential elements in advanced bulk CMOS technologies

✍ Scribed by Seifert, N.; Ambrose, V.; Gill, B.; Shi, Q.; Allmon, R.; Recchia, C.; Mukherjee, S.; Nassif, N.; Krause, J.; Pickholtz, J.; Balasubramanian, A.

Book ID: 118121457
Publisher: IEEE
Year: 2010
Weight: 397 KB
Volume: 0
Category: Article
ISBN: 1424454301
DOI: 10.1109/irps.2010.5488831

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