𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Title Page

Book ID: 121695849
Publisher: IEEE
Year: 2009
Weight: 117 KB
Category: Article
DOI: 10.1109/sispad.2009.5290188

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Design of FinFET SRAM Cells Using a Statistical Compact Model

✍ Lu, Darsen D.; Lin, Chung-Hsun; Yao, Shijing; Xiong, Weize; Bauer, Florian; Clea 📂 Article 📅 2009 🏛 IEEE ⚖ 505 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - An Investigation on Effective Mobility in Nanowire FETs under Quasi-Ballistic Conditions

✍ Gnani, Elena; Gnudi, Antonio; Reggiani, Susanna; Baccarani, Giorgio 📂 Article 📅 2009 🏛 IEEE ⚖ 135 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - TCAD Investigation of Abnormal Degradation of Inhibited Cells in NAND Flash Structures

✍ Postel-Pellerin, J.; Lalande, F.; Canet, P.; Bouchakour, R.; Jeuland, F.; Bertel 📂 Article 📅 2009 🏛 IEEE ⚖ 327 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Atomistic Simulation of Band-to-Band Tunneling in III-V Nanowire Field-Effect Transistors

✍ Basu, Dipanjan; Register, Leonard F.; Gilbert, Matthew J.; Banerjee, Sanjay K. 📂 Article 📅 2009 🏛 IEEE ⚖ 326 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Monte Carlo-Based Analytical Models for Electron and Hole Electrical Parameters in Strained SiGeC Alloys

✍ Michaillat, Marc; Rideau, Denis; Aniel, Frederic; Tavernier, Clement; Jaouen, He 📂 Article 📅 2009 🏛 IEEE ⚖ 474 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Modeling the Effect of Conduction Band Density of States on Interface Trap Occupation and Its Influence on 4H-SiC MOSFET Performance

✍ Potbhare, Siddharth; Akturk, Akin; Goldsman, Neil; Lelis, Aivars; Dhar, Sarit; R 📂 Article 📅 2009 🏛 IEEE ⚖ 319 KB