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[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Design of FinFET SRAM Cells Using a Statistical Compact Model

✍ Scribed by Lu, Darsen D.; Lin, Chung-Hsun; Yao, Shijing; Xiong, Weize; Bauer, Florian; Cleavelin, Cloves R.; Niknejad, Ali M.; Hu, Chenming

Book ID: 120024364
Publisher: IEEE
Year: 2009
Weight: 505 KB
Category: Article
DOI: 10.1109/SISPAD.2009.5290234

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