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[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - TCAD Investigation of Abnormal Degradation of Inhibited Cells in NAND Flash Structures

✍ Scribed by Postel-Pellerin, J.; Lalande, F.; Canet, P.; Bouchakour, R.; Jeuland, F.; Bertello, B.; Villard, B.

Book ID: 121688323
Publisher: IEEE
Year: 2009
Weight: 327 KB
Category: Article
DOI: 10.1109/sispad.2009.5290208

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