✦ LIBER ✦

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Hot carrier stress degradation modes in p-type high voltage LDMOS transistors

✍ Scribed by Enichlmair, H.; Park, J. M.; Carniello, S.; Loeffler, B.; Minixhofer, R.; Levy, M.

No coin nor oath required. For personal study only.

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