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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability challenges for power devices under active cycling

✍ Scribed by Kanert, Werner

Book ID: 126701255
Publisher: IEEE
Year: 2009
Weight: 469 KB
Category: Article
ISBN: 1424428882
DOI: 10.1109/IRPS.2009.5173288

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