𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - CMOS device design-in reliability approach in advanced nodes

✍ Scribed by Huard, Vincent; Parthasarathy, CR; Bravaix, Alain; Guerin, Chloe; Pion, Emmanuel

Book ID: 120043071
Publisher: IEEE
Year: 2009
Weight: 557 KB
Category: Article
ISBN: 1424428882
DOI: 10.1109/IRPS.2009.5173321

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability challenges for power devices under active cycling

✍ Kanert, Werner 📂 Article 📅 2009 🏛 IEEE ⚖ 469 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - NSEU impact on commercial avionics

✍ Matthews, David C.; Dion, Michael J. 📂 Article 📅 2009 🏛 IEEE ⚖ 417 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Improvised explosive device (IED) counter-measures in Iraq

✍ Ziegler, James 📂 Article 📅 2009 🏛 IEEE ⚖ 110 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Qualification issues and pitfalls for advanced semiconductor devices in space

✍ Sunderland, David A. 📂 Article 📅 2009 🏛 IEEE ⚖ 402 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Accurate product lifetime predictions based on device-level measurements

✍ Nigam, T.; Parameshwaran, B.; Krause, G. 📂 Article 📅 2009 🏛 IEEE ⚖ 395 KB

[IEEE 2009 IEEE International Reliabilit

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability issues in AlGaN based deep ultraviolet light emitting diodes

✍ Khan, Asif; Hwang, Seongmo; Lowder, Jonathan; Adivarahan, Vinod; Fareed, Qhalid 📂 Article 📅 2009 🏛 IEEE ⚖ 299 KB