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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Reliability issues in AlGaN based deep ultraviolet light emitting diodes

✍ Scribed by Khan, Asif; Hwang, Seongmo; Lowder, Jonathan; Adivarahan, Vinod; Fareed, Qhalid

Book ID: 126720923
Publisher: IEEE
Year: 2009
Weight: 299 KB
Category: Article
ISBN: 1424428882
DOI: 10.1109/IRPS.2009.5173229

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