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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Accurate product lifetime predictions based on device-level measurements

✍ Scribed by Nigam, T.; Parameshwaran, B.; Krause, G.

Book ID: 121272400
Publisher: IEEE
Year: 2009
Weight: 395 KB
Category: Article
ISBN: 1424428882
DOI: 10.1109/IRPS.2009.5173322

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