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[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Prediction of Gate Dielectric Breakdown in the CDM timescale utilizing very fast transmission line pulsing

✍ Scribed by Ellis, David F.; Malobabic, Slavica; Liou, Juin J.; Hajjar, Jean-Jacques

Book ID: 121820367
Publisher: IEEE
Year: 2009
Weight: 247 KB
Category: Article
ISBN: 1424428882
DOI: 10.1109/IRPS.2009.5173315

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