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[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - Back-end-of-line integration approaches for resistive memories

✍ Scribed by Jousseaume, V.; Buckley, J.; Bernard, Y.; Gonon, P.; Vallee, C.; Mougenot, M.; Feldis, H.; Minoret, S.; Chamiot-Maitral, G.; Persico, A.; Zenasni, A.; Gely, M.; Barnes, J.P.; Martinez, E.; Grampeix, H.; Guedj, C.; Nodin, J.F.; De Salvo, B.

Book ID: 126695137
Publisher: IEEE
Year: 2009
Weight: 555 KB
Category: Article
ISBN: 1424444926
DOI: 10.1109/IITC.2009.5090335

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