𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - An Analysis of Temperature Impact on MOSFET Mismatch

✍ Scribed by Mennillo, S.; Spessot, A.; Vendrame, L.; Bortesi, L.

Book ID: 124076196
Publisher: IEEE
Year: 2009
Weight: 339 KB
Category: Article
ISBN: 1424442591
DOI: 10.1109/ICMTS.2009.4814610

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 IEEE International Conference

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Array Test Structure for Ultra-Thin Gate Oxide Degradation Issues

✍ Hafkemeyer, Kristian M.; Domdey, Andreas; Schroeder, Dietmar; Krautschneider, Wo 📂 Article 📅 2009 🏛 IEEE ⚖ 961 KB

[IEEE 2009 IEEE International Conference

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Mismatch Measure Improvement Using Kelvin Test Structures in Transistor Pair Configuration in Sub-Hundred Nanometer MOSFET Technology

✍ Mezzomo, Cecilia M.; Marin, Mathieu; Leyris, Cedric; Ghibaudo, Gerard 📂 Article 📅 2009 🏛 IEEE ⚖ 314 KB

[IEEE 2009 IEEE International Conference

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - S-Parameter-Based Modal Decomposition of Multiconductor Transmission Lines and Its Application to De-Embedding

✍ Amakawa, S.; Yamanaga, K.; Ito, H.; Sato, T.; Ishihara, N.; Masu, K. 📂 Article 📅 2009 🏛 IEEE ⚖ 557 KB

[IEEE 2009 IEEE International Conference

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Advanced Method for Measuring Ultra-Low Contact Resistivity Between Silicide and Silicon Based on Cross Bridge Kelvin Resistor

✍ Isogai, T.; Tanaka, H.; Teramoto, A.; Goto, T.; Sugawa, S.; Ohmi, T. 📂 Article 📅 2009 🏛 IEEE ⚖ 158 KB

[IEEE ICMTS 2002. 2003 International Con

[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - A test circuit for measuring MOSFET threshold voltage mismatch

✍ Terada, K.; Eimitsu, M. 📂 Article 📅 2003 🏛 IEEE ⚖ 256 KB

[IEEE 2012 IEEE International Conference

[IEEE 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS) - San Diego, CA, USA (2012.03.19-2012.03.22)] 2012 IEEE International Conference on Microelectronic Test Structures - An extended de-embedding method for on-wafer components

✍ Yu-Ling Lin, ; Hsiao-Tsung Yen, ; Ho-Hsiang Chen, ; Chewn-Pu Jou, ; Chin-Wei Kuo 📂 Article 📅 2012 🏛 IEEE ⚖ 957 KB