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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - TSNWFET for SRAM cell application: Performance variation and process dependency

✍ Scribed by Sung Dae Suk, ; Yun Young Yeoh, ; Ming Li, ; Kyoung Hwan Yeo, ; Sung-Han Kim, ; Dong-Won Kim, ; Park, Donggun; Won-Seoung Lee,

Book ID: 126657999
Publisher: IEEE
Year: 2008
Weight: 988 KB
Category: Article
ISBN: 142441802X
DOI: 10.1109/VLSIT.2008.4588555

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