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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - On the dynamic resistance and reliability of phase change memory

✍ Scribed by Rajendran, B.; Lee, M-H.; Breitwisch, M.; Burr, G. W.; Shih, Y-H.; Cheek, R.; Schrott, A.; Chen, C-F.; Lamorey, M.; Joseph, E.; Zhu, Y.; Dasaka, R.; Flaitz, P. L.; Baumann, F. H.; Lung, H-L.; Lam, C.

Book ID: 120031610
Publisher: IEEE
Year: 2008
Weight: 538 KB
Category: Article
ISBN: 142441802X
DOI: 10.1109/VLSIT.2008.4588576

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